ISTFA 2002

ISTFA 2002

Proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz

eBook - 2002
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This proceedings from the November 2002 conference on the analysis of microelectronic device and system failures reflects the current unpredictability of economics and of the next generation of electronic mass products. The 102 papers explore metrology, materials, optical probing, system level analysis, and the failure analysis process. Topics incl
Publisher: Materials Park, OH : ASM International, 2002.
ISBN: 0871707713
Branch Call Number: ELECTRONIC BOOK
Characteristics: 1 online resource (xxiv, 789 p.) : ill.

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